Electron Microscopy and Analysis 2003 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
Coordonnateurs : McVitie S, McComb D
Date de parution : 02-2004
15.2x22.9 cm
Date de parution : 10-2019
15.6x23.4 cm
Thèmes d’Electron Microscopy and Analysis 2003 :
Mots-clés :
Angle Annular Dark Field Image; Field Emission Gun Transmission Electron; grain; AFM; boundaries; SEM; energy; Data Sets; loss; HAADF Imaging; spectroscopy; HAADF; field; EFTEM; emission; Eel; gun; Eel Spectrum; high-angle; Stacking Faults; annular; Sample Preparation; Electron Holography; Electron Tomography; QD; TEM Analysis; QW; Dislocation Loops; Fib Milling; Zone Axis; TEM Imaging; UHR; AEA Technology; InGaN Quantum Wells; Beam Tilt