Lavoisier S.A.S.
14 rue de Provigny
94236 Cachan cedex
FRANCE

Heures d'ouverture 08h30-12h30/13h30-17h30
Tél.: +33 (0)1 47 40 67 00
Fax: +33 (0)1 47 40 67 02


Url canonique : www.lavoisier.fr/livre/autre/advances-in-imaging-and-electron-physics/hawkes-peter-w/descriptif_3781413
Url courte ou permalien : www.lavoisier.fr/livre/notice.asp?ouvrage=3781413

0 article 

 Frais de port 0,01€*

Exclusivité web : à partir de 35 euros d’achat, frais de port à 1 centime pour les expéditions vers la France métropolitaine, la Suisse et l’UE avec Colissimo ou GLS

Advances in Imaging and Electron Physics Advances in Imaging and Electron Physics Series

Langue : Anglais

Auteur :

Couverture de l’ouvrage Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronicsand Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Direct Digital Electron DetectorsR. Clough and A.I. Kirkland2. Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage MaterialsP. Sciau3. Quest for Ultimate Resolution using Coherent Electron Waves: An Aberration Corrected High-Voltage Electron MicroscopeT. Tanigaki, T. Akashi, Y. Takahashi, T. Kawasaki and H. Shinada

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, and digital image processing

Date de parution :

Ouvrage de 154 p.

15x22.8 cm

Disponible chez l'éditeur (délai d'approvisionnement : 14 jours).

193,44 €

Ajouter au panier