International symposium for testing and failure analysis (book and CD-ROM) (ISTFA 2004)

This volume collects papers addressing the current state of the art in microelectronics testing and failure analysis. The coverage will be of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Includes coverage of new and unique tools and methodologies, applications and results.

Advanced Techniques. Failure Analysis Process. MEMS. Sample Preparation. System Level Analysis. Die Level Fault Isolation. Optical Techniques. Package Level Analysis. Yield Enhancement. Discretes and Passives. Design for Analysis. Metrology and Materials Analysis. Optoelectronic Devices. Circuit Edit Techniques. SPM Techniques. Nanotechnology.