Soft Error Mechanisms, Modeling and Mitigation, Softcover reprint of the original 1st ed. 2016
Introduction.- Mitigation of Single Event Effects.- Transmission Gate (TG) Based Soft Error Mitigation Methods.- Single Event Soft Error Mechanisms.- Modeling Single Event Crosstalk Noise in Nanometer Technologies.- Modeling of Single Event Coupling Delay and Speedup Effects.- Single Event Upset Hardening of Interconnects.- Soft-Error Aware Power Optimization.- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.
Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
Date de parution : 03-2016
Ouvrage de 105 p.
15.5x23.5 cm
Date de parution : 06-2018
Ouvrage de 105 p.
15.5x23.5 cm