Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon, Softcover reprint of the original 1st ed. 2004 Computational Microelectronics Series
Auteur : Pichler Peter
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
First comprehensive review of intrinsic point defects and impurities in silicon
Compiles all known information about structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behavior of intrinsic point defects, acceptor and donor impurities, isovalent impurities, chalcogens, and halogens
Date de parution : 11-2012
Ouvrage de 554 p.
17.8x25.4 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 276,06 €
Ajouter au panierDate de parution : 06-2004
Ouvrage de 554 p.
17.8x25.4 cm