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Terahertz Metrology

Langue : Anglais

Auteur :

Couverture de l’ouvrage Terahertz Metrology

This book presents you with a review of modern THz systems and devices, followed by chapters detailing the measurement issues encountered in using each of the main types of THz systems, and a guide to performing measurements rigorously. Particular attention is given to evaluating uncertainties, and recognizing potential sources of errors. The main focus is on time-domain spectroscopy, the most widely-used technique. Additional chapters are devoted to Fourier transform spectrometers, vector network analyzers, and imaging. You will also find examples of applications with the emphasis on utility, both in research and in industry.

Why THz Metrology?; THz Time-Domain Spectrometers; Parameter Extraction in Time-Domain Spectrometers; Metrology for Time-Domain Spectrometers; Evaluation of Uncertainty in Time-Domain Spectroscopy; Metrology for Fourier Transform Spectrometers; THz Spectrometer Calibration; THz Imaging; High-Resolution Frequency Measurements; Metrology for Vector Network Analyzers; THz Power Measurements; THz Optics; THz Laser Sources; Electronic THz Sources and Detectors.

Date de parution :

Ouvrage de 360 p.

Disponible chez l'éditeur (délai d'approvisionnement : 16 jours).

Prix indicatif 217,91 €

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