Surface Science Tools for Nanomaterials Characterization, Softcover reprint of the original 1st ed. 2015
Coordonnateur : Kumar Challa S.S.R.
Higher Resolution Scanning Probe Methods for Magnetic Imaging.- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials.- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography.- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy.- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM).- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy.- Magnetic Force Microscopy.- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films.- FIM-Characterized Tips for SPM.- Scanning Conductive Torsion Mode Microscopy.- Scanning Probe Acceleration Microscopy (SPAM).- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures.- Field Ion Microscopy (FIM).- Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces.
Encyclopedic presentation of Surface Science Tools for Nanomaterials Characterization
Comprehensive presentation of Surface Science Tools for Nano materials
Characterization Fourth volume of a 40-volume series on nanoscience and nanotechnology included in Springer Materials
Highly application-oriented overview of modern topics of Surface Science Tools for Nanomaterials Characterization
Date de parution : 10-2016
Ouvrage de 652 p.
15.5x23.5 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 316,49 €
Ajouter au panierDate de parution : 03-2015
Ouvrage de 652 p.
15.5x23.5 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 316,49 €
Ajouter au panier