Lavoisier S.A.S.
14 rue de Provigny
94236 Cachan cedex

Heures d'ouverture 08h30-12h30/13h30-17h30
Tél.: +33 (0)1 47 40 67 00
Fax: +33 (0)1 47 40 67 02

Url canonique :
Url courte ou permalien :

Spectroscopic Ellipsometry for Photovoltaics, 1st ed. 2018 Volume 1: Fundamental Principles and Solar Cell Characterization Springer Series in Optical Sciences Series, Vol. 212

Langue : Anglais

Coordonnateurs : Fujiwara Hiroyuki, Collins Robert W.

Couverture de l’ouvrage Spectroscopic Ellipsometry for Photovoltaics

Spectroscopic ellipsometry has been a key measurement technique in characterizing solar cell component materials and device structures. Specifically, the ellipsometry technique remains the only method by which the optical constants and the band gap can be determined accurately. Furthermore, very high sensitivity for material layer thickness makes an ellipsometry technique as a suitable method for device structural characterization. The first volume of Spectroscopic Ellipsometry for Photovoltaics presents fundamental principles of the ellipsometry technique, with a focus on characterization methods of solar cell materials and devices. In particular, this book covers the data analysis methods for a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, CdTe and III-V) to more advanced emerging materials (Cu2ZnSnS4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. A comprehensive review for transparent conductive oxides is also provided. The key objective of this book is to provide theory, measurement, and data analysis/modeling for a variety of solar cell component materials and basic device structures.

Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se2.- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization.- Cu2ZnSn(S,Se)4 and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a  professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. 

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Presents ellipsometry characterization of solar cell materials/devices

Provides easy-to-understand explanations of ellipsometry data analysis

Includes optical constants for all solar-cell component layers

Date de parution :

Ouvrage de 594 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

232,09 €

Ajouter au panier
En continuant à naviguer, vous autorisez Lavoisier à déposer des cookies à des fins de mesure d'audience. Pour en savoir plus et paramétrer les cookies, rendez-vous sur la page Confidentialité & Sécurité.