Energy Dispersive X-ray Analysis in the Electron Microscope, 2002 Microscopy Handbooks (BIOS) Series, Vol. 46
Auteurs : Garrett-Reed Anthony, Bell David C.
Date de parution : 02-2002
Ouvrage de 160 p.
15.5x23.5 cm
Publication abandonnée
Thème d’Energy Dispersive X-ray Analysis in the Electron Microscope :
Mots-clés :
SEM; characteristic; X-ray Detector; count; Incomplete Charge Collection; rate; Ionization Cross-section; microprobe; Mass Absorption Coefficients; detectors; Crystal Spectrometers; spectrum; NiO Thin Film; crystal; Characteristic X-rays; spectrometer; Electron Energy Loss Spectroscopy; atomic; X-ray Microanalysis; number; HPGe Detector; Eel Spectrum; EDX Spectrum; X-ray Mapping; Top Hat Filtering; Beam Voltage; Pulse Processor; EDX Detector; Successful Stem; ZAF Correction; EDX System; Electron Hole Pair; Fluorescence Yield; SDD; Incident Electron