Surface Analysis of Paper Routledge Revivals Series
Auteurs : Conners Terrance E., Banerjee Sujit
First published in 1995, Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper.
Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods.
Each chapter contains:
1. Physical Characterization of Surfaces. 2. Spectroscopic Methods. 3. Emerging Technologies. Index.
Date de parution : 07-2019
17.8x25.4 cm
Date de parution : 02-2021
17.8x25.4 cm
Thèmes de Surface Analysis of Paper :
Mots-clés :
Liquid Metal Ion Source; paper industry; ISO Brightness; paper surface properties controlling; Sample Preparation; confocal microscopy; Moisture Content; paper surface properties characterizing; Pilot Paper Machine; Kraft Pulps; Eel Spectrum; Interaction Volume; EDS Analysis; ToF Sim; EDS Spectrum; Photon Tunneling; Raman Spectroscopy; Static Sim; Ft Raman Spectrum; Contact Angle; XPS Spectrum; Sim Instrument; Imaging Sim; Unbleached Kraft Pulps; XPS Analysis; Resonant Techniques; Mechanical Pulps; AKD; Kappa Number