Reliability of Semiconductor Lasers and Optoelectronic Devices Woodhead Publishing Series in Electronic and Optical Materials Series
Coordonnateurs : Herrick Robert, Ueda Osamu
Robert W. Herrick and Qiang Guo
2. Reliability engineering in optoelectronic devices and fiber optic transceivers
Robert W. Herrick
3. Case studies in fiber optic reliability
Robert W. Herrick
4. Materials science of defects in GaAs-based semiconductor lasers
Kunal Mukherjee
5. Grown-in defects and thermal instability affecting the reliability of lasers: III-Vs versus III nitrides
Osamu Ueda and Shigetaka Tomiya
6. Reliability of lasers on silicon substrates for silicon photonics
Justin C. Norman, Daehwan Jung, Alan Y. Liu, Jennifer Selvidge, Kunal Mukherjee, John E. Bowers and Robert W. Herrick
7. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs
C. De Santi, A. Caria, F. Piva, G. Meneghesso, E. Zanoni and M. Meneghini
Materials Scientists and Electrical Engineers primarily working in R&D, secondary audience in academia
Dr. and Prof. Osamu Ueda received BS and PhD degrees from the University of Tokyo, Japan, in 1974 and 1990, respectively. He joined Fujitsu Laboratories Ltd. in 1974. Since then, his research has been focused on the evaluation of defects and microstructures in various semiconducting materials and degradation mechanism of compound semiconductor optical devices such as semiconductor lasers and LEDs for over 30 years. The key technique of his work is transmission electron microscopy for the characterization of defects in semiconductors and degraded optical devices. He left Fujitsu Laboratories Ltd. in 2005 and joined the Kanazawa Institute of Technology, Tokyo, Japan as a professor until 2019. He is currently a visiting professor at the Meiji University, Tokyo, Japan. He authored more than 150 scientific papers including 30 invited papers, 5 books, and 56 patents.
- Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry
- Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products
- Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Date de parution : 03-2021
Ouvrage de 334 p.
15.2x22.8 cm
Thèmes de Reliability of Semiconductor Lasers and Optoelectronic... :
Mots-clés :
?Accelerated aging; Burgers vector; Case studies; Composition-modulated structure; Dark defects; Defects in LEDs; Degradation; Dislocation; Dislocation loop; Early failures; Fiber optic transceivers; Field failure; GR-468; GaN LEDs; Grown-in defects; Heteroepitaxial integration; Heteroepitaxy; Heterogeneous integration; Inclusion; Laser burn-in; Laser burn-in optimization; Laser degradation; Microtwin; Misfit dislocation; Optoelectronic reliability; Ordered structure; Point defect diffusion; Precipitate; Quantum dot lasers; Reliability data collection; Reliability engineering; Reliability monitoring; Reliability of blue LEDs; Reliability of fiber optic transceivers; Reliability of ultraviolet LEDs; Reliability qualification; Semiconductor laser reliability; Silicon photonics; Stacking fault