Long-Term Non-Operating Reliability of Electronic Products
Auteur : Pecht Judy
Date de parution : 12-2017
15.6x23.4 cm
Thèmes de Long-Term Non-Operating Reliability of Electronic Products :
Mots-clés :
Silicon Silicon Oxide Interface; Electrostatic Discharge; Whisker Growth; Multichip Module; Electroless Nickel; Mechanical Failure Mechanisms; Accelerated Life Testing; Non-operating Conditions; Hermetic Packages; Intermetallic Formation; Stress Corrosion Cracking; Parameter Variation Analysis; Crevice Corrosion; Galvanic Corrosion; Antistatic Bags; Varactor Diodes; MOS Device; Gunn Diodes; CDM; SEU; Thermoelectric Coolers; Dominant Failure Mechanisms; Step Stress Test; Reliability Prediction Method; Adhering Corrosion Products