X-ray Microscopy Advances in Microscopy and Microanalysis Series

Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.

1. X-ray microscopes: a short introduction; 2. A bit of history; 3. X-ray physics; 4. Imaging Physics; 5. X-ray focusing optics; 6. X-ray microscope systems; 7. X-ray microscope instrumentation; 8. X-ray tomography; 9. X-ray spectromicroscopy; 10. Coherent imaging; 11. Radiation damage and cryo microscopy; 12. Applications, and future prospects.

Chris Jacobsen is an Argonne Distinguished Fellow at Argonne National Laboratory, Illinois, and a Professor of Physics and Astronomy at Northwestern University, Illinois. He is also a Fellow of the American Association for the Advancement of Science, the American Physical Society, and the Optical Society of America.