Nonlinear Circuit Simulation and Modeling Fundamentals for Microwave Design The Cambridge RF and Microwave Engineering Series
Langue : Anglais
Auteurs : Pedro José Carlos, Root David E., Xu Jianjun, Nunes Luís Cótimos
A practical, tutorial guide to the nonlinear methods and techniques needed to design real-world microwave circuits.
Discover the nonlinear methods and tools needed to design real-world microwave circuits with this tutorial guide. Balancing theoretical background with practical tools and applications, it covers everything from the basic properties of nonlinear systems such as gain compression, intermodulation and harmonic distortion, to nonlinear circuit analysis and simulation algorithms, and state-of-the-art equivalent circuit and behavioral modeling techniques. Model formulations discussed in detail include time-domain transistor compact models and frequency-domain linear and nonlinear scattering models. Learn how to apply these tools to designing real circuits with the help of a power amplifier design example, which covers all stages from active device model extraction and the selection of bias and terminations, through to performance verification. Realistic examples, illustrative insights and clearly conveyed mathematical formalism make this an essential learning aid for both professionals working in microwave and RF engineering and graduate students looking for a hands-on guide to microwave circuit design.
1. Linear and nonlinear circuits; 2. Basic nonlinear microwave circuit analysis techniques; 3. Linear behavioral models in the frequency domain: S-parameters; 4. Nonlinear frequency domain behavioral models; 5. Linear device modeling; 6. Nonlinear device modeling; 7. Nonlinear microwave CAD tools in a power amplifier design example.
José Carlos Pedro is a Professor of Electrical Engineering at Universidade de Aveiro, Portugal, and a Senior Researcher at Instituto de Telecomunicações, Portugal, and a Fellow of the IEEE.
David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011).
Jianjun Xu is Senior Device Modeling R&D Engineer at Keysight Technologies, Inc.
Luís Cótimos Nunes is a radio-frequency Research Assistant at Instituto de Telecomunicações, Universidade de Aveiro, Portugal.
David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011).
Jianjun Xu is Senior Device Modeling R&D Engineer at Keysight Technologies, Inc.
Luís Cótimos Nunes is a radio-frequency Research Assistant at Instituto de Telecomunicações, Universidade de Aveiro, Portugal.
Date de parution : 06-2018
Ouvrage de 356 p.
17.8x25.3 cm
Disponible chez l'éditeur (délai d'approvisionnement : 14 jours).
Prix indicatif 107,80 €
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