An Introduction to Microwave Measurements
Auteur : Basu Ananjan
Go Beyond Basic Distributed Circuit Analysis
An Introduction to Microwave Measurements
It starts with a brief overview of the basic theory and the building blocks required for understanding and using microwave measurement techniques. Oriented around the most commonly used instruments in microwave measurements?the network analyzer, the spectrum analyzer, and synthesized microwave source?it introduces the latest instruments and techniques and provides a brief description of traditional measurement techniques (slotted waveguide etc.).
It offers an introduction to the mathematical basis behind microwave measurements as well as an overview of some of the practical components that are frequently used in microwave instruments. Observing that students generally grasp the subject better when actual numbers are given, rather than symbolic relations, the author includes examples involving numerical values that are scattered throughout the book. He also provides a detailed description of the vector network analyzer and the spectrum analyzer (explaining its principle of operation and calibration), which form the backbone of modern microwave measurements. In addition, he briefly addresses advanced topics such as pulsed measurements and non-linear network analysis.
Comprised of ten chapters, this text:
- Discusses noise measurement and synthesized signal generation
- Provides an overview of RF wafer-probing and modern microwave oscilloscopes?relatively advanced topics
- Contains detailed derivations and exercises
An Introduction to Microwave Measurements
Introduction. Background Information. Traditional Measurement Techniques. Vector Network Analyzer. Spectrum Analyzer. Noise Measurements. Microwave Signal Generation. Microwave Oscilloscopes. Wafer Probing. Application Examples. Appendix. Index.
Ananjan Basu completed his BTech in Electrical engineering and MTech in Communication and Radar Engineering from IIT Delhi in 1991 and 1993, respectively, and his PhD in electrical engineering from the University of California, Los Angeles, in 1998. He has been employed at the Centre for Applied Research in Electronics, IIT Delhi as visiting faculty from 1999 to 2000, as assistant professor from 2000 to 2005, as associate professor from 2005 to 2012, and as professor from 2013. His specialization is in microwave and millimeter-wave component design and characterization. He has published more than 80 papers in journals and conferences.
Date de parution : 07-2017
15.6x23.4 cm
Date de parution : 12-2014
15.6x23.4 cm
Thèmes d’An Introduction to Microwave Measurements :
Mots-clés :
Cathode Ray Oscilloscopes; Phase Noise; S-Parameters; Error Box; Fractional-N Synthesis; Vector Network Analyzer; Frequency Offset; NF; Transmission Measurement; Spectrum Analyzer Display; General Electronic Measurements; SMA Connector; Material Property Measurement; Wafer Probing; Direct Digital Synthesis (Dds); Real Time Oscilloscope; Finger Modeling; Microwave Signal Generation; Black-Box Representation; Measuring Noise Figures; Microwave Filters; Lo Frequency; The Power Meter; Probe Tip; Frequency Limitations; PFD; Directional Couplers; Oscilloscope; High-Speed Adc; Dc Probes; Reflection Measurement; Flash ADC; Smart Phones; Microwave Measurements; Signal Flow Graph; Probe Guide; Direct Digital Synthesis; Equivalent Electrical Model; Lo Signal; Ta Ge