Aberration Theory in Electron and Ion Optics Advances in Imaging and Electron Physics Series
Coordonnateurs : Hawkes Peter W., Hÿtch Martin
- The electron optical imaging system and its aberrations
- The electromagnetic deflection system and its aberrations
- The electromagnetic multipole system and its aberrations
- The ion optical system and its aberrations
- Computer aided design of electron and ion optical systems
Jiye Ximen
Jiye Ximen
Jiye Ximen
Jiye Ximen
Jiye Ximen
Afterword: Life and works of Jiye Ximen
Peter Hawkes
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP), is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM), joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
Date de parution : 06-2023
Ouvrage de 374 p.
15.2x22.8 cm
Thèmes d’Aberration Theory in Electron and Ion Optics :
Mots-clés :
Aberration correction; Aberration theory; Aberrations; Deflection systems; Double-focusing mass spectrometers; Field calculation; Finite difference method; Finite element method; Focusing properties; Fringing fields; Gaussian properties; Liouville's theorem; Magnetic lenses; Moving objective lens; Multipoles; Octopoles; Parasitic aberrations; Paraxial properties; Quadrupoles; Round electron lenses; Saturation; Sector fields; Trajectory calculation