Particle Characterization in Technology Volume I: Application and Microanalysis
Coordonnateur : Beddow John Keith
Date de parution : 11-2017
17.8x25.4 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 220,72 €
Ajouter au panierThèmes de Particle Characterization in Technology :
Mots-clés :
Sample Preparation; Alvin Lieberman; Maximum Feret's Diameter; Brian H; Kaye; Particle Systems; David L; Davidson; Minimum Ignition Temperature; David L; O; Smith; Primary Ion Beam; John A; Hersey; Bulk Solids; John Gavrilovic; Moisture Content; John Keith Beddow; Fractal Dimension; K; N; Palmer; Sim Technique; Paul Wieser; Richardson Plot; R; F; Karuhn; Dust Explosion; R; H; Berg; Stress Path; Raimund Kaufmann; LAMMA; Robert A; Lohnes; Si Yield; Shepard Kinsman; Sim; RSFs; Particle Size Analysis Result; Fractal Description; Lateral Stress Ratio; Mohr Circle; Dust Layer; Minimum Ignition Energy; Dust Fires; British Pharmacopoeia; Maximum Explosion Pressure