VLSI Design and Test, 2013 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings Communications in Computer and Information Science Series, Vol. 382
Langue : Anglais
Coordonnateurs : Gaur Manoj Singh, Zwolinski Mark, Laxmi Vijay, Boolchandani D., Sing Virendra, Singh Adit
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.
17th International Symposium on VLSI Design and Test, VDAT 2013
Date de parution : 12-2013
Ouvrage de 388 p.
15.5x23.5 cm
Thème de VLSI Design and Test :
Mots-clés :
SRAM arrays; VLSI; digital circuits; multi-processor architectures; network-on-chip
© 2024 LAVOISIER S.A.S.
