Resonant X-Ray Scattering in Correlated Systems, 1st ed. 2017 Springer Tracts in Modern Physics Series, Vol. 269
Coordonnateurs : Murakami Youichi, Ishihara Sumio
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).
Up-to-date review on x-ray scattering and diffraction
X-ray scattering studies of transition-metal oxides
Contributions from internationally renowned experts
Includes supplementary material: sn.pub/extras
Date de parution : 01-2017
Ouvrage de 241 p.
15.5x23.5 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 137,14 €
Ajouter au panier