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Quality and Reliability of Technical Systems (2nd Ed., Softcover reprint of the original 2nd ed. 1997) Theory, Practice, Management

Langue : Anglais

Auteur :

Couverture de l’ouvrage Quality and Reliability of Technical Systems
High reliability, maintanability, and safety are expected fro complex equipment and systems. This book presents state-of-the-art methods and procedures used for cost and time effective quality and reliability assurance during the design and production of equipment and systems. It is based on more than 20 years experience gained by the author in research and industry.
The book covers theory, practice, and management aspects and addresses the needs of scientists, system-oriented engineers, engineers in development and production and project and quality assurance managers. The second edition has been completely updated revised and includes modern concepts such as Total Quality Management (TQM) and Concurrent Engineering.
1 Basic Concepts, Quality and Reliability Assurance of Complex Equipment and Systems.- 1.1 Introduction.- 1.2 Basic Concepts.- 1.2.1 Reliability.- 1.2.2 Failure.- 1.2.3 Failure Rate.- 1.2.4 Maintenance, Maintainability.- 1.2.5 Logistical Support.- 1.2.6 Availability.- 1.2.7 Safety, Risk, and Risk Acceptance.- 1.2.8 Quality.- 1.2.9 Cost and System Effectiveness.- 1.2.10 Product Liability.- 1.2.11 Historical Development.- 1.3 Quality and Reliability Assurance Tasks for Complex Equipment and Systems.- 1.4 Basic Quality and Reliability Assurance Rules.- 1.5 Elements of a Total Quality Management System.- 1.6 Quality and Reliability Assurance Handbook.- 1.7 Motivation and Training.- 2 Reliability Analysis During the Design Phase.- 2.1 Introduction.- 2.2 Predicted Reliability of Equipment and Systems with Simple Structures.- 2.2.1 Required Function.- 2.2.2 Reliability Block Diagram.- 2.2.3 Operating Conditions at Component Level, Stress Factors.- 2.2.4 Failure Rate of Electronic Components.- 2.2.5 Reliability of One-Item Structures.- 2.2.6 Reliability of Series-Parallel Structures.- 2.2.6.1 Items without Redundancy.- 22.6.2 Concept of Redundancy.- 2.2.6.3 Parallel Models.- 2.2.6.4 Series/Parallel Structures.- 2.2.6.5 Majority Redundancy.- 2.2.7 Part Count Method.- 2.3 Reliability of Systems with Complex Structures.- 2.3.1 Key Item Method.- 2.3.1.1 Bridge Structures.- 2.3.1.2 Rel. Block Diagram in which Elements Appear More than Once.- 2.3.2 Successful Path Method.- 2.3.3 State Space Method.- 2.3.4 Boolean Function Method.- 2.3.5 Parallel Models with Constant Failure Rates and Load Sharing.- 2.3.6 Elements With More Than One Failure Mode.- 2.3.7 Fault Tolerant Structures.- 2.4 Reliability Allocation.- 2.5 Mechanical Reliability.- 2.6 Failure Mode Analysis.- 2.7 Reliability Aspects in Design Reviews.- 3 Qualification Tests for Components and Assemblies.- 3.1 Selection Criteria for Electronic Components.- 3.1.1 Environment.- 3.1.2 Performance Parameters.- 3.1.3 Technology.- 3.1.4 Manufacturing Quality.- 3.1.5 Long-Term Behavior of Performance Parameters.- 3.1.6 Reliability.- 3.2 Qualification Tests for Complex Electronic Components.- 3.2.1 Electrical Test of Complex ICs.- 3.2.2 Characterization of Complex ICs.- 3.2.3 Environmental and Special Tests of Complex ICs.- 3.2.4 Reliability Tests.- 3.3 Failure Modes, Failure Mech., and Failure Analysis of Electronic Components.- 3.3.1 Failure Modes of Electronic Components.- 3.3.2 Failure Mechanisms of Electronic Components.- 3.3.3 Failure Analysis of Electronic Components.- 3.4 Qualification Tests for Electronic Assemblies.- 4 Maintainability Analysis.- 4.1 Maintenance, Maintainability.- 4.2 Maintenance Concept.- 4.2.1 Fault Detection and Isolation.- 4.2.2 Equipment and System Partitioning.- 4.2.3 User Documentation.- 4.2.4 Training of Operating and Maintenance Personnel.- 4.2.5 User Logistical Support.- 4.3 Maintainability Aspects in Design Reviews.- 4.4 Predicted Maintainability.- 4.4.1 Calculation of MTTRS.- 4.4.2 Calculation of MTTPMS.- 4.5 Basic Models for Spare Part Provisioning.- 4.5.1 Centralized Logistical Support, Nonrepairable Spare Parts.- 4.5.2 Decentralized Logistical Support, Nonrepairable Spare Parts.- 4.5.3 Repairable Spare Parts.- 4.5.4 Cost Considerations.- 5 Design Guidelines for Reliability, Maintainability, and Software Quality.- 5.1 Design Guidelines for Reliability.- 5.1.1 Derating.- 5.1.2 Cooling.- 5.1.3 Moisture.- 5.1.4 Electromagnetic Compatibility, ESD Protection.- 5.1.5 Components and Assemblies.- 5.1.5.1 Component Selection.- 5.1.5.2 Component Use.- 5.1.5.3 PCB and Assembly Design.- 5.1.5.4 PCB and Assembly Manufacturing.- 5.1.5.5 Storage and Transportation.- 5.1.6 Particular Guidelines for IC Design and Manufacturing.- 5.2 Design Guidelines for Maintainability.- 5.2.1 General Guidelines.- 5.2.2 Testability.- 5.2.3 Accessibility, Exchangeability.- 5.2.4 Operation, Adjustment.- 5.3 Design Guidelines for Software Quality.- 5.3.1 Guidelines for Software Defect Prevention.- 5.3.2 Configuration Management.- 5.3.3 Guidelines for Software Testing.- 5.3.4 Software Quality Growth Models.- 6 Reliability and Availability of Repairable Systems.- 6.1 Introduction and General Assumptions.- 6.2 One-Item Structure.- 6.2.1 One-Item Structure New at Time t = 0.- 6.2.1.1 Reliability Function.- 6.2.1.2 Point Availability.- 6.2.1.3 Average Availability.- 6.2.1.4 Interval Reliability.- 6.2.1.5 Special Kinds of Availability.- 6.2.2 One-Item Structure New at Time t = 0 and with Constant Failure Rate ?.- 6.2.3 One-Item Structure with Arbitrary Initial Conditions at Time t = 0.- 6.2.4 Asymptotic Behavior.- 6.2.5 Steady-State Behavior.- 6.3 Systems without Redundancy.- 6.3.1 Series Structure with Constant Failure and Repair Rates.- 6.3.2 Series Structure with Constant Failure and Arbitrary Repair Rates.- 6.3.3 Series Structure with Arbitrary Failure and Repair Rates.- 6.4 1-out-of-2 Redundancy.- 6.4.1 l-out-of-2 Redundancy with Constant Failure and Repair Rates.- 6.4.2 l-out-of-2 Redundancy with Constant Failure and Arbitrary Repair Rates.- 6.4.3 l-out-of-2 Redundancy with Const. Failure Rate only in the Reserve State.- 6.5 k-out-of-n Redundancy.- 6.5.1 k-out-of-n Warm Redundancy Constant Failure and Repair Rates.- 6.5.2 k-out-of-n Active Redundancy with Const. Failure and Arbitrary Repair Rates.- 6.6 Simple Series/Parallel Structures.- 6.7 Approximate Expressions for Large Series/Parallel Structures.- 6.7.1 Introduction.- 6.7.2 Application to a Practical Example.- 6.8 Systems with Complex Structure.- 6.8.1 General Considerations.- 6.8.2 Computer Aided Reliability and Availability Prediction.- 6.9 Influence of Imperfect Switching.- 6.10 Influence of Preventive Maintenance.- 6.10.1 One-item Repairable Structure.- 6.10.2 l-out-of-2 Active Redundancy with Hidden Failures in one Element.- 7 Statistical Quality Control and Reliability Tests.- 7.1 Statistical Quality Control.- 7.1.1 Estimation of a Defective Probability p.- 7.1.2 Simple Two-sided Sampling Plans for the Demonstration of a Probability p.- 7.1.2.1 Simple Two-sided Sampling Plans.- 7.1.2.2 Sequential Tests.- 7.1.3 One-sided Sampling Plans for the Demonstration of a Probability p.- 7.2 Statistical Reliability Tests.- 7.2.1 Estimation and Demonstration of a Reliability or Availability Value.- 7.2.2 Estimation and Demonstration of a Constant Failure Rate ? or MTBF = 1/?.- 7.2.2.1 Estimation of a constant Failure Rate ? or of MTBF = 1/?.- 1.2.22 Simple Two-sided Test for the Demonstration of ? or MTBF = 1/?.- 12.23 Simple One-sided Test for the Demonstration of ? or MTBF = 1/?.- 7.3 Statistical Maintainability Tests.- 7.3.1 Estimation of an MTTR.- 7.3.2 Demonstration of an MTTR.- 7.4 Accelerated Testing.- 7.5 Goodness-of-fit Tests.- 7.5.1 Kolmogorov-Smirnov Test.- 7.5.2 Chi-square Test.- 8 Quality and Reliability Assurance During the Production Phase.- 8.1 Basic Activities.- 8.2 Testing and Screening of Electronic Components.- 8.2.1 Testing of Electronic Components.- 8.2.2 Screening of Electronic Components.- 8.3 Testing and Screening of Electronic Assemblies.- 8.4 Test and Screening Strategies, Economic Aspects.- 8.4.1 Basic Considerations.- 8.4.2 Quality Cost Optimization.- 8.4.3 Procedure to handle first deliveries.- 8.5 Reliability Growth.- A1 Terms and Definitions.- A2 Quality and Reliability Standards.- A2.1 Introduction.- A2.2 Requirements in the Industrial Field.- A2.3 Requirements in the Aerospace, Defense, and Nuclear Fields.- A3 Definition and Realization of Quality and Reliability Requirements.- A3.1 Definition of Quality and Reliability Requirements.- A3.2 Realization of Quality and Reliabilty Requirements.- A3.3 Elements of a Quality and Reliability Assurance Program.- A3.3.1 Project Organization, Planning, and Scheduling.- A3.3.2 Quality and Reliability Requirements.- A3.3.3 Reliability and Safety Analyses.- A3.3.4 Selection and Qualific. of Components, Materials, and Manuf. Processes.- A3.3.5 Configuration Management.- A3.3.6 Quality Tests.- A3.3.7 Quality Data Reporting System.- A4 Checklists for Design Reviews.- A4.1 System Design Review.- A4.2 Preliminary Design Reviews (Assembly Level).- A4.3 Critical Design Review (System Level).- A5 Requirements for Quality Data Reporting Systems.- A6 Basic Probability Theory.- A6.1 Field of Events.- A6.2 Concept of Probability.- A6.3 Conditional Probability, Independence.- A6.4 Fundamental Rules of Probability Theory.- A6.4.1 Addition Theorem for Mutually Exclusive Events.- A6.4.2 Multiplication Theorem for Two Independent Events.- A6.4.3 Multiplication Theorem for Arbitrary Events.- A6.4.4 Addition Theorem for Arbitrary Events.- A6.4.5 Theorem of Total Probability.- A6.5 Random Variables, Distribution Functions.- A6.6 Numerical Parameters of Random Variables.- A6.6.1 Expected Value (Mean).- A6.6.2 Variance.- A6.6.3 Modal Value, Quantile, Median.- A6.7 Multidimensional Random Variables, Conditional Distributions.- A6.8 Numerical Parameters of Random Vectors.- A6.8.1 Covariance Matrix, Correlation Coefficient.- A6.8.2 Further Properties of Expected Value and Variance.- A6.10 Distribution Functions used in Reliability Analyses.- A6.10.1 Exponential Distribution.- A6.10.2 Weibull Distribution.- A6.10.4 Normal Distribution.- A6.10.5 Lognormal Distribution.- A6.10.6 Uniform Distribution.- A6.10.7 Binomial Distribution.- A6.10.8 Poisson Distribution.- A6.10.9 Geometric Distribution.- A6.10.10 Hypergeometric Distribution.- A6.11 Limit Theorems.- A6.11.1 Law of Large Numbers.- A6.11.2 Central Limit Theorem.- A7 Basic Stochastic Process Theory.- A7.1 Introduction.- A7.2 Renewal Processes.- A7.2.1 Renewal Function, Renewal Density.- A7.2.2 Recurrence Times.- A7.2.3 Asymptotic Behavior.- A7.2.4 Stationary Renewal Processes.- A7.2.5 Poisson Processes.- A7.3 Alternating Renewal Processes.- A7.4 Regenerative Processes.- A7.5 Markov Processes with Finitely Many States.- A7.5.1 Markov Chains with Finitely Many States.- A7.5.2 Markov Processes with Finitely Many States.- A7.5.3 State Probabilities and Sojourn Times in a Given Class of States.- A7.5.3.1 Method of Differential Equations.- A7.5.3.2 Method of Integral Equations.- A7.5.3.3 Stationary State and Asymptotic Behavior.- A7.5.4 Birth and Death Process.- A7.6 Semi-Markov Processes with Finitely Many States.- A7.7 Semi-regenerative Processes.- A7.8 Nonregenerative Stochastic Processes.- A8 Basic Mathematical Statistics.- A8.1 Empirical Methods.- A8.1.1 Empirical Distribution Function.- A8.1.2 Empirical Moments and Quantiles.- A8.1.3 Further Applications of the Empirical Distribution Function.- A8.2 Parameter Estimation.- A8.2.1 Point Estimation.- A8.2.2 Interval Estimation.- A8.3 Testing Statistical Hypotheses.- A8.3.1.1 Simple Two-sided Sampling Plan.- A8.3.1.2 Sequential Test.- A8.3.1.3 Simple One-sided Sampling Plan.- A9 Tables and Charts.- A9.1 Standard Normal Distribution.- A9.5 Table for the Kolmogorov-Smirnov Test.- A9.6 Gamma function.- A9.7 Laplace Transform.- A9.8 Probability Charts.- A9.8.1 Lognormal Probability Chart.- A9.8.2 Weibull Probability Chart.- A9.8.3 Normal Probability Chart.- Acronyms.- References.

State-of-the-art methods and procedures for cost and time effective QA during design, development, and production

Covers theory, practice and management aspects

Includes such modern concepts as TQM and concurrent engineering

Date de parution :

Ouvrage de 502 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

Prix indicatif 137,14 €

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