Lavoisier S.A.S.
14 rue de Provigny
94236 Cachan cedex
FRANCE

Heures d'ouverture 08h30-12h30/13h30-17h30
Tél.: +33 (0)1 47 40 67 00
Fax: +33 (0)1 47 40 67 02


Url canonique : www.lavoisier.fr/livre/autre/nanocharacterization-techniques/descriptif_3777961
Url courte ou permalien : www.lavoisier.fr/livre/notice.asp?ouvrage=3777961

Nanocharacterization Techniques Micro and Nano Technologies Series

Langue : Anglais

Coordonnateurs : de Oliveira Jr Osvaldo, Marystela Ferreira LG, de Lima Leite Fábio, Luzia Da Róz Alessandra

Couverture de l’ouvrage Nanocharacterization Techniques

Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.

1. Scanning Electron Microscopy 2. Atomic Force Microscopy: A Powerful Tool for Electrical Characterization 3. Spectroscopic Techniques for Characterization of Nanomaterials 4. Dynamic Light Scattering Applied to Nanoparticle Characterization 5. X-Ray Diffraction and Scattering by Nanomaterials 6. Surface Plasmon Resonance (SPR) for Sensors and Biosensors

Materials scientists and engineers, as well as those working in the natural and life sciences seeking a reference work outlining the essential principles of nanostructures and nanomaterials. Scientists working in related disciplines, who may be relatively new to nanotechnology, and graduate students.

Prof. Osvaldo N Oliveira Jr completed his PhD at the University of Wales, Bangor, UK. He is a professor at the São Carlos Institute of Physics, University of São Paulo. He has published about 470 articles in refereed journals, 15 book chapters and has submitted seven patent applications. These works received about 9000 citations (as of August, 2016). He has supervised 40 masters and PhD candidates. His main areas of expertise are in nanostructured organic films, and natural language processing. He is a member of the São Paulo State Academy of Sciences. He is a member of the editorial board of three journals, and is also associated editor of the Journal of Nanoscience and Nanotechnology. He received the Scopus Award 2006 awarded by Elsevier in Brazil and Capes, as one of 16 outstanding Brazilian researchers, based on the number of publications and citations.

.
Prof. Dr . Marystela Ferreira received her PhD in Physical Chemistry from University of São Paulo, Brazil. She is currently a professor at the Federal University of São Carlos, and specializes in the following areas: eletrooxidation , thin films , sensors and biosenssores , phenolic compounds , HPLC and MEQC.
Fabio Leite de Lima obtained his PhD in Materials Science and Engineering from University of São Paulo, Brazil, Between 2006 and 2009, he was a Postdoctoral Fellow at the Institute of Physics of São Carlos (IFSC-USP) in collaboration with Embrapa Agricultural Instrumentation. He was Fellow Young Researcher FAPESP (2009-2012). He has collaborated with Prof. Dr. Alan Graham MacDiarmid, winner of the Nobel Prize in Chemistry 2000, with whom he published the first article in the Journal of Nanoscience and Nanotechnology, in 2009. He is currently Adjunct Professor at the Federal University of São Carlos (UFSCar) - Campus Sorocaba, Coordinator of the Research Group in Nanoneurobiofísica and Future Scientist Program. He has conducted research the areas of nanoscience and nanotechnology, with emphasis

  • Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs
  • Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used
  • Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered
  • Serves as an important, go-to reference for materials scientists and engineers

Ces ouvrages sont susceptibles de vous intéresser