Materials Characterization Using Nondestructive Evaluation (NDE) Methods Woodhead Publishing Series in Electronic and Optical Materials Series
Coordonnateurs : Huebschen Gerhard, Altpeter Iris, Tschuncky Ralf, Herrmann Hans-Georg
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.
Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.
1. Atomic force microscopy (AFM) for materials characterization 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization 3. X-ray micro-tomography for materials characterization 4. X-ray diffraction (XRD) techniques for materials characterization 5. Microwave, millimeter wave and terahertz techniques for materials characterization 6. Acoustical microscopy for materials characterization 7. Ultrasonic techniques for materials characterization 8. Electromagnetic techniques for materials characterization 9. Hybrid methods for materials characterization
Dr. Iris Altpeter worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, and was the head of the department for “Materials characterization, defect detection and lifetime management.
Dr. Ralf Tschuncky has been a member of the department for materials characterization at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany for more than 15 years.
Prof. Hans-Georg Herrmann holds the chair of Lightweight Systems at Saarland University, Germany, and is also head of the department “In-service Inspection & Life-cycle Monitoring and deputy director at the Fraunhofer IZFP.
- Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques
- Reviews the determination of microstructural and mechanical properties
- Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries
- Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Date de parution : 04-2016
Ouvrage de 320 p.
15x22.8 cm
Thème de Materials Characterization Using Nondestructive... :
Mots-clés :
3D scanning; Acoustic imaging; Acoustic microscopy; Adhesive joints; AFM probe; AFM; Anisotropy; Backscattered electrons (BSEs)Electron diffraction; Calibration procedures; Combination methods; Composite materials; Computed tomography; Dynamic magnetostriction; Eddy current techniques; Electron energy loss spectroscopy (EELS)High-resolution; Hardness depth; Hardness; Hybrid methods; In situ X-ray diffraction; Material characterization; Material density; Materials characterization; Microfocus technology; Micromagnetic techniques; Microstructure; Microwave; Millimeter wave; Moisture; Nondestructive; Phase analysis; Phase contrast; Porosity; Qualitative phase analysis; Quantitative phase analysis; Reconstruction; Residual stresses; Rietveld method; Scanning electron microscopy (SEM)Scanning transmission electron microscopy (STEM)Secondary electrons (SEs)Transmission electron microscopy (TEM)X-ray spectroscopy; Signal processing; Spot welding; Terahertz; Texture; Topography surface scanning; Ultrasonic scanning; Ultrasonic techniques; X-ray absorption; X-ray detector; X-ray diffraction