Lavoisier S.A.S.
14 rue de Provigny
94236 Cachan cedex

Heures d'ouverture 08h30-12h30/13h30-17h30
Tél.: +33 (0)1 47 40 67 00
Fax: +33 (0)1 47 40 67 02

Url canonique :
Url courte ou permalien :

Ion Beam Modification of Solids, Softcover reprint of the original 1st ed. 2016 Ion-Solid Interaction and Radiation Damage Springer Series in Surface Sciences Series, Vol. 61

Langue : Anglais

Coordonnateurs : Wesch Werner, Wendler Elke

Couverture de l’ouvrage Ion Beam Modification of Solids
This book presents the method of ion beam modification of solids in realization, theory and applications in a comprehensive way. It provides a review of the physical basics of ion-solid interaction and on ion-beam induced structural modifications of solids. Ion beams are widely used to modify the physical properties of materials. A complete theory of ion stopping in matter and the calculation of the energy loss due to nuclear and electronic interactions are presented including the effect of ion channeling. To explain structural modifications due to high electronic excitations, different concepts are presented with special emphasis on the thermal spike model. Furthermore, general concepts of damage evolution as a function of ion mass, ion fluence, ion flux and temperature are described in detail and their limits and applicability are discussed. The effect of nuclear and electronic energy loss on structural modifications of solids such as damage formation, phase transitions and amorphization is reviewed for insulators and semiconductors. Finally some selected applications of ion beams are given.
Physical Basics.- Damage Formation and Amorphisation by Nuclear Energy Deposition.- Damage Formation and Amorphisation by High Electronic Energy Deposition (Swift Heavy Ion Irradiation).- Selected Applications of Ion Irradiation.

Explains models for description of damage evolution by both nuclear and electronic energy loss

Presents the state of the art of knowledge of damage formation in insulators and semiconductors due to nuclear and electronic excitation

Describes the applications of ion beam methods

Date de parution :

Ouvrage de 534 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

Prix indicatif 179,34 €

Ajouter au panier
En continuant à naviguer, vous autorisez Lavoisier à déposer des cookies à des fins de mesure d'audience. Pour en savoir plus et paramétrer les cookies, rendez-vous sur la page Confidentialité & Sécurité.