International Tables for Crystallography, Volume C (3^rd Ed.) Mathematical, Physical and Chemical Tables IUCr Series. International Tables for Crystallography Series

International Tables for Crystallography is the definitive resource and reference work for crystallography and structural science.

Each of the volumes in the series contains articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials. Emphasis is given to symmetry, diffraction methods and techniques of crystal-structure determination, and the physical and chemical properties of crystals. The data are accompanied by discussions of theory, practical explanations and examples, all of which are useful for teaching.

Volume C provides the mathematical, physical and chemical information needed for experimental studies in structural crystallography. This volume covers all aspects of experimental techniques, using all three principal radiation types (X-ray, electron and neutron), from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. Each chapter is supported by a substantial collection of references, and the volume ends with a section on precautions against radiation injury.

Eleven chapters have been revised, corrected or updated for the third edition of Volume C.

More information on the series can be found at: http://it.iucr.org

Preface (A.J.C. Wilson).

Preface to the Third Edition (E. Prince).

PART 1 CRYSTAL GEOMETRY AND SYMMETRY.

1.1 Summary of General Formulae (E. Koch).

1.2 Application to the Crystal Systems (E. Koch).

1.3 Twinning (E. Koch).

1.4 Arithmetic Crystal Classes and Symmorphic Space Groups (A.J.C. Wilson).

PART 2 DIFFRACTION GEOMETRY AND ITS PRACTICAL REALIZATION.

2.1 Classification of Experimental Techniques (J.R. Helliwell).

2.2 Single-Crystal X-Ray Techniques (J.R. Helliwell).

2.3 Powder and Related Techniques: X-Ray Techniques (W. Parrish and J.I. Langford).

2.4 Powder and Related Techniques: Electron and Neutron Techniques.

2.5 Energy-Dispersive Techniques.

2.6 Small-Angle Techniques.

2.7 Topography (A.R. Lang).

2.8 Neutron Diffraction Topography (M. Schlenker and J. Baruchel).

2.9 Neutron Reflectometry (G.S. Smith and C.F. Majkrzak).

PART 3 PREPARATION AND EXAMINATION OF SPECIMENS.

3.1 Preparation, Selection and Investigation of Specimens (P.F. Lindley).

3.2 Determination of the Density of Solids.

3.3 Measurement of Refractive Index (E.S. Larsen, Jr., R. Meyrowitz and A.J.C. Wilson).

3.4 Mounting and Setting of Specimens for X-Ray Crystallographic Studies (P.F. Lindley).

3.5 Preparation of Specimens for Electron Diffraction and Electron Microscopy (N.J. Tighe, J.R. Fryer and H.M. Flower).

3.6 Specimens for Neutron Diffraction (B.T.M. Willis).

PART 4 PRODUCTION AND PROPERTIES OF RADIATIONS.

4.1 Radiations Used in Crystallography (V. Valvoda).

4.2 X-Rays

4.3 Electron Diffraction.

4.4 Neutron Techniques.

PART 5 DETERMINATION OF LATTICE PARAMETERS.

5.1 Introduction (A.J.C. Wilson).

5.2 X-Ray Diffraction Methods: Polycrystalline (W. Parrish, A.J.C. Wilson and J.I. Langford).

5.3 X-Ray Diffraction Methods: Single Crystal (E. Galdecka).

5.4 Electron Diffraction Methods.

5.5 Neutron Methods (B.T.M. Willis).

PART 6 INTERPRETATION OF DIFFRACTED INTENSITIES.

6.1 Intensity of Diffracted Intensities.

6.2 Trigonometric Intensity Factors (H. Lipson, J.I. Langford and H.-C. Hu).

6.3 X-Ray Absorption (E.N. Malsen).

6.4 The Flow of Radiation in a Real Crystal (T.M. Sabine).

PART 7 MEASUREMENT OF INTENSITIES.

7.1 Detectors for X-Rays.

7.2 Detectors for Electrons (J.N. Chapman).

7.3 Thermal Neutron Detection (P. Convert and P. Chieux).

7.4 Correction of Systematic Errors.

7.5 Statistical Fluctuations (A.J.C. Wilson).

PART 8 REFINEMENT OF STRUCTURAL PARAMETERS.

8.1 Least Squares (E. Prince and P.T. Boggs).

8.2 Other Refinement Methods (E. Prince and D.M. Collins).

8.3 Constraints and Restraints in Refinement (E. Prince, L.W. Finger and J.H. Konnert).

8.4 Statistical Significance Tests (E. Prince and C.H. Spiegelman).

8.5 Detection and Treatment of Systematic Error (E. Prince and C.H. Spiegelman).

8.6 The Rietveld Method (A. Albinati and B.T.M. Willis).

8.7 Analysis of Charge and Spin Densities (P. Coppens, Z. Su and P.J. Becker).

8.8 Accurate Structure-Factor Determination with Electron Diffraction (J. Gjønnes).

PART 9 BASIC STRUCTURAL FEATURES.

9.1 Sphere Packings and Packings of Ellipsoids (E. Koch and W. Fischer).

9.2 Layer Stacking.

9.3 Typical Interatomic Distances: Metals and Alloys (J.L.C. Daams, J.R. Rodgers and P. Villars).

9.4 Typical Interatomic Distances: Inorganic Compounds (G. Bergerhoff and K. Brandenburg).

9.5 Typical Interatomic Distances: Organic Compounds (F.H. Allen, D.G. Watson, L. Brammer, A.G. Orpen and R. Taylor).

9.6 Typical Interatomic Distances: Organometallic Compounds and Coordination Complexes of the d- and f-Block Metals (A.G. Orpen, L. Brammer, F.H. Allen, D.G. Watson and R. Taylor).

9.7 The Space-Group Distribution of Molecular Organic Structures (A.J.C. Wilson, V.L. Karen and A. Mighell).

9.8 Incommensurate and Commensurate Modulated Structures (T. Janssen, A. Janner, A. Looijenga-Vos and P.M. de Wolff).

PART 10 PRECAUTIONS AGAINST RADIATION INJURY (D.C. Creagh and S. Martinez-Carrera).

10.1 Introduction.

10.2 Protection from Ionizing Radiation.

10.3 Responsible Bodies.

Author Index.

Subject Index.

E. Prince is the author of International Tables for Crystallography, 3rd Edition, Volume C, Mathematical, Physical and Chemical Tables, published by Wiley.