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EMC of Analog Integrated Circuits, 2010 Analog Circuits and Signal Processing Series

Langue : Anglais

Auteurs :

Couverture de l’ouvrage EMC of Analog Integrated Circuits

Environmental electromagnetic pollution has drastically increased over the last decades. The omnipresence of communication systems, various electronic appliances and the use of ever increasing frequencies, all contribute to a noisy electromagnetic environment which acts detrimentally on sensitive electronic equipment. Integrated circuits must be able to operate satisfactorily while cohabiting harmoniously in the same appliance, and not generate intolerable levels of electromagnetic emission, while maintaining a sound immunity to potential electromagnetic disturbances: analog integrated circuits are in particular more easily disturbed than their digital counterparts, since they don't have the benefit of dealing with predefined levels ensuring an innate immunity to disturbances. The objective of the research domain presented in EMC of Analog Integrated Circuits is to improve the electromagnetic immunity of considered analog integrated circuits, so that they start to fail at relevantly higher conduction levels than before.

Basic EMC Concepts at IC Level.- EMC of Integrated Circuits versus Distortion.- EMI Resisting Analog Output Circuits.- EMI Resisting Analog Input Circuits.- EMI Resisting Bandgap References and Low Dropout Voltage Regulators.- Epilogue.
EMC-aware analog integrated circuit design is domain which is continuously gaining in importance Paradoxically, literature describing and solving EMC problems in integrated circuits is not widely spread: most EMC-related works describe what should be done outside the integrated circuit (like shielding, etc.). Conversely, this research looks at how EMC incompatibilities can be tackled on-chip The structure of the book explains how to identify and solve EMC problems in output stages, input stages and power supply terminals by means of practical design cases The design cases described in this work have been validated with measurements and/or simulations Last but not least, stressing the first point in this list, the authors strongly believe that EMC problems will keep on increasing in the future Includes supplementary material: sn.pub/extras

Date de parution :

Ouvrage de 243 p.

15.5x23.5 cm

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Prix indicatif 158,24 €

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Date de parution :

Ouvrage de 243 p.

15.5x23.5 cm

Sous réserve de disponibilité chez l'éditeur.

158,24 €

Ajouter au panier