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Defects in Semiconductors Semiconductors and Semimetals Series

Langue : Anglais

Auteur :

Couverture de l’ouvrage Defects in Semiconductors

This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields.

The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths.

  1. Role of Defects in the Dopant Diffusion in Si
  2. Peter Pichler

  3. Electron and Proton Irradiation of Silicon
  4. Arne Nylandsted Larsen and Abdelmadjid Mesli

  5. Ion Implantation Defects and Shallow Junctions in SI and GE
  6. Enrico Napolitani and Giuliana Impellizzeri

  7. Defective Solid-phase Epitaxial Growth of Si
  8. Nicholas G. Rudawski, Aaron G. Lind and Thomas P. Martin

  9. Nanoindentation of Silicon and Germanium
  10. Mangalampalli S. R. N. Kiran, Bianca Haberl, Jodie E. Bradby and James S. Williams

  11. Analytical Techniques for Electrically Active Defect Detection
  12. Eddy Simoen, Johan Lauwaert and Henk Vrielinck

  13. Surface and Defect States in Semiconductors Investigated by Surface Photovoltage
  14. Daniela Cavalcoli, Beatrice Fraboni and Anna Cavallini

  15. Point Defects in ZnO
  16. Matthew D. McCluskey

  17. Point Defects in GaN
  18. Michael A. Reshchikov

  19. Point Defects in Silicon CarbideNaoya Iwamoto and Bengt G. Svensson

students, researchers from both academics and industrial companies dealing with semiconductor or semiconductor applications

  • Expert contributors
  • Reviews of the most important recent literature
  • Clear illustrations
  • A broad view, including examination of defects in different semiconductors

Date de parution :

Ouvrage de 458 p.

15x22.8 cm

Disponible chez l'éditeur (délai d'approvisionnement : 14 jours).

193,44 €

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