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Applications of Microscopy in Materials and Life Sciences, 1st ed. 2021 Proceedings of 12th Asia-Pacific Microscopy Conference Springer Proceedings in Materials Series, Vol. 11

Langue : Anglais

Coordonnateurs : Ghosal Partha, Carter C. Barry, Vinothkumar Kutti Ragunath, Sarkar Rajdeep

Couverture de l’ouvrage Applications of Microscopy in Materials and Life Sciences

This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM ? FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike.

Electron Microscopy: An important tool for preparation and characterization of asymmetric ceramic-polymer composite nanofiltration membrane.- Development of thin aluminide coatings on Alloy 800 substrate.- Efficiency of the Solid Oxide Cell (SOC) using Nanocrystalline Mixed Ionic and Electronic Conducting (MIEC) Oxides as Air Electrode Materials in Conjunction with Doped-Ceria based Interlayers.- Role of second phase particles on in-situ deformation of an AZ80 Mg alloy.- Growth of Spheroidal Silicon Carbide by Arc Plasma Treatment.- TEM Studies of Segregation in a Ge-Sb-Te Alloy during Heating.- Microstructural Attributes to the Stability of ‘Brass’-Texture during Cold Rolling of AA7010 High Strength Aluminium Alloy.- Cryo-EM structure of rotavirus VP3 reveals novel insights into its role in RNA capping and endogenous transcription.- Structural biology research in India: A thriving cryo-EM community heralds a new era.

Dr. Partha Ghosal is a senior Scientist G in DMRL, Hyderabad and is heading the Electron Microscopy Group. He received his Ph.D. from Indian Institute of Technology (IIT-BHU), Varanasi in the field of Metallurgical Engineering in 1996 and worked on the effect of crystal defects in the diffraction theory for ordered HCP alloys. He spent one year as DAAD visiting scientist in TU Clausthal, Germany to work on EBSD techniques. Currently, he is working in the area of advanced characterization techniques, along with SEM, EBSD, FIB, TEM, HRTEM and Raman-AFM systems. His current interests include in-situ mechanical testing and heating experiments of nano and advanced materials inside electron microscopes and advanced Raman analysis for these materials. Extensive electron microscopic works on Ti-based alloys, W-based alloys and nano-composites are also in the scope of his interest. He is involved in establishing an advanced materials characterization centre for the country at DRDO. He has around 146 international papers, over 100 invited presentations and 3 patents to his credit. He is a fellow of EMSI with 25 years of research experience. He is member of Electron Crystallography (IUCr) from India. He is reviewer of 11 reputed international journals and life member of professional national bodies such as IIM, MRSI, EMSI and MSI.

Dr. C. Barry Carter is a Research Professor and Emeritus Professor at the University of Connecticut, USA. He holds a B.A., M.A. and Sc.D. from Cambridge University, an M.Sc. from Imperial College, London, and a D.Phil. from Oxford University. After 6 years in Oxford, he moved to Cornell where he spent 14 years leaving as a full Professor. He spent 16 years as Professor and the 3M Endowed Multidisciplinary Chair in the Department of Chemical Engineering and Materials Science at the University of Minnesota and 5 years as Head of UConn’s Department of Chemical, Materials and Biomolecular Engineering. He is a CINT Distin

Comprises select peer-reviewed proceedings of the international conference APMC 2020 Reports on recent advances in microscopy-based microanalysis, SPM, Cryo-Electron Microscopy, 3D-APT, in-situ techniques, etc. Presents new theories and applications in the field of microscopy

Date de parution :

Ouvrage de 268 p.

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Date de parution :

Ouvrage de 268 p.

15.5x23.5 cm

Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).

158,24 €

Ajouter au panier