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Advances in Imaging and Electron Physics

Langue : Anglais

Directeur de Collection : Hawkes Peter W.

Couverture de l’ouvrage Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  1. Small Angle Scatter with Correlation, Scatter and Intermediate Functions

    2. Jay Theodore Cremer, Jr.

  2. Nuclear Scatter of Neutron Spin States

    3. Jay Theodore Cremer, Jr.

  3. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope

    4. Christian Dwyer

  4. Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques

    5. Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand CoukaandMaxime Carré

  5. Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy

    6. Partha Pratim Mondal and Alberto Diaspro

  6. Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations

Stephen J. Sangwine

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Date de parution :

Ouvrage de 360 p.

15x22.8 cm

Disponible chez l'éditeur (délai d'approvisionnement : 14 jours).

204,32 €

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Mots-clés :

4Pi-geometry; Aperture Engineering; Babinet's principle; Color image processing; Guinier; intermediate; and Porod regimes; Heisenberg Uncertainty Principle and commutation of operators; Hit-or-Miss Transform; Mathematical Morphology; Multiphoton Microscopy; Multiple Excitation Spot Optical Microscopy; Object Detection; Point Spread Function Engineering; Porod's law; Rayleigh-Gans scatter; Scanning transmission electron microscopy; Super-resolution Microscopy; Template Matching; chemical mapping; atomic resolution; coherent and incoherent; elastic and inelastic components of the pair correlation function; convolution and cross correlation; correlation function; scatter function; intermediates function; and their relationships; electron energy loss spectroscopy; energy dispersive x-ray spectroscopy; homogeneous coordinates; ladder (creation and annihilation) operators; linear vector processing; lowering and raising operators; macroscopic differential cross section for neutron scatter; neutron scatter in solids; liquids; and gases; neutron scatter length density; neutron scatter length for polarized neutron scatter; neutron spin state scatter from nuclear spin states; neutron spin; nuclear spin; and combined spin operators; partial differential and total cross sections for polarized neutron scatter; particle number density operator and pair correlation function; particle structure factor; polarized neutron scatter with averaging over nuclear spin states and isotopes; principle of detailed balance; projective geometry; random variables; correlation; and independence; resolution of scatter vector for X-ray or neutron SANS instrument; scalar and vector operators; scatter amplitudes and intensity; small-angle neutron scatter; spin and orbital angular momentum vector operators; static approximation; total; differential; and partial differential neutron scatter cross sections; vector image processing

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Advances in Imaging and Electron Physics 204,32 €

Advances in Imaging and Electron Physics 204,32 €

Advances in Imaging and Electron Physics 204,32 €