Advances in Imaging and Electron Physics Silicon-Based Millimetre-wave Technology Advances in Imaging and Electron Physics Series
Langue : Anglais
Auteur : DEEN Jamal
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Measurement Techniques and Practical Issues
- Transmission lines and passive components
- Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
- Field-effect types of transistors
- RF MEMS Switches and Switch Matrices
- Substrate-Integrated Antennas on Silicon
Jamal Deen
Guennadi A. Kouzaev
Mohamed Bakr
Benjamin Iniguez
Mojgan Daneshmand
Natalia K. Nikolova
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Date de parution : 12-2012
Ouvrage de 484 p.
15x22.8 cm
Thème d’Advances in Imaging and Electron Physics :
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