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Principles of semiconductor testing
Auteur(s) : AFSHAR
Date de parution: 12-1995
Langue : ANGLAIS
350p. 23.5x15.3 Hardback
Etat : Disponible chez l'éditeur (délai de livraison : 10 jours)
| Commentaire | | This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation, and noise sources. This book has gathered under one cover diverse and comprehensive information that the test and process professional will found invaluable. The techniques outlined herein will help insure that the test methods and data collected reflect actual device performance. |
| Résumé | | Diode and transistor operation. Integrated circuit test basics. Digital logic test. Noise identification. Operational amplifier general information. Data acquisition devices. Digital signal processing. CODEC (Coder/Decoder). |
| Sommaire | | Preface, Diode and transistor operation, Integrated circuit test basics, Digital logic test, Noise identification, Operational amplifier general information, Data acquisition devices, Digital signal processing, CODEC (Coder/Decoder), References |
Thèmes :
- Electricite - electronique - telecoms / Electronique / Théories, appareillages, composants
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