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Frequency standards : basics and applications

Auteur(s) : RIEHLE Fritz
Date de parution: 11-2004
Langue : ANGLAIS
400p. 24x17 Hardback
Etat : Disponible chez l'éditeur (délai de livraison : 10 jours)

Table des matières
Preface. Basics of Frequency Standards. Characterization of Amplitude Stability and Frequency Stability. Resonators. Atomic Frequency References. Frequency Stabilization of Oscillators. Maser. Atomic Clocks. Laser Frequency Standards. Ion-Trap Frequency Standards. Pulsars. Time Dissemination. Technical Applications. Physical and Technical Limits of Frequency Standards.

Résumé
Of all measurement quantities, the frequency represents the one that can be determined with the highest degree of accuracy. This also allows precise measurements of other physical and technical quantities, whenever they could be put down to a frequency measurement. This volume covers the important methods and techniques developed for frequency measurements in physics, electronics, quantum electronics, statistics, and communication theory. After a review of the basics principles of various types of frequency standards, the realisation of commonly used components is monitored. The book continues with the description and characterisation of the most important frequency standards from atomic clocks to frequency stabilised lasers. Finally topical applications in engineering, telecommunication, and metrology are discussed.

Sommaire
Preface. Basics of Frequency Standards. Characterization of Amplitude Stability and Frequency Stability. Resonators.Atomic Frequency References. Frequency Stabilization of Oscillators. Maser.Atomic Clocks. Laser Frequency Standards. Ion-Trap Frequency Standards. Pulsars.Time Dissemination. Technical Applications. Physical and Technical Limits of Frequency Standards.

Thèmes :
  • Mathematiques & physique / Physique theorique,quantique et statistique / Techniques, applications industrielles
  • Mathematiques & physique / Optique / Masers, lasers, holographie, applications industrielles
  • Mathematiques & physique / Metrologie / Théories, mesures, techniques


   
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