Physical Limitations of Semiconductor Devices, 2008
Auteurs : Vashchenko Vladislav A., Sinkevitch V. F.
Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulation
Applies directly to the area of ESD protection design
Explains complex physical descriptions so that they can be applied to the decision making process
Date de parution : 04-2008
Ouvrage de 330 p.
15.5x23.5 cm
Mots-clés :
ESD; Leistungsfeldeffekttransistor; SOA; Sinkevitch; Transistor; Vashchenko; bipolar junction transistor; bipolar power transistor; catastrophic failures; development; electrostatic discharge; field-effect transistor; metal oxide semiconductur field-effect transistor; safe-operating area; semiconductors