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Physical Limitations of Semiconductor Devices, 2008

Langue : Anglais

Auteurs :

Couverture de l’ouvrage Physical Limitations of Semiconductor Devices

Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.

Failures of Semiconductor Device.- Theoretical Basis of Current Instability in Transistor Structures.- Thermal Instability Mechanism.- Isothermal Current Instability in Silicon BJT and MOSFETs.- Isothermal Instability in Compound Semiconductor Devices.- Degradation Instabilities.- Conductivity Modulation in ESD devices.- Physical Approach to Reliability.

Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulation

Applies directly to the area of ESD protection design

Explains complex physical descriptions so that they can be applied to the decision making process