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Principles of semiconductor testing

Auteur : AFSHAR

Couverture de l'ouvrage Principles of semiconductor testing

106,32 €

Disponible chez l'éditeur (délai d'approvisionnement : 10 jours).

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Date de parution : 12-1995
Langue : ANGLAIS
350p. 23.5x15.3 Hardback

Commentaire de Principles of semiconductor testing

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation, and noise sources. This book has gathered under one cover diverse and comprehensive information that the test and process professional will found invaluable. The techniques outlined herein will help insure that the test methods and data collected reflect actual device performance.

Résumé de Principles of semiconductor testing

Diode and transistor operation. Integrated circuit test basics. Digital logic test. Noise identification. Operational amplifier general information. Data acquisition devices. Digital signal processing. CODEC (Coder/Decoder).

Sommaire de Principles of semiconductor testing

Preface, Diode and transistor operation, Integrated circuit test basics, Digital logic test, Noise identification, Operational amplifier general information, Data acquisition devices, Digital signal processing, CODEC (Coder/Decoder), References

Public concerné de Principles of semiconductor testing

Semiconductor design & test engineers

Thème de Principles of semiconductor testing