Electronic Design Automation Synthesis, Verification, and Test Systems on Silicon Series
Coordonnateurs : Wang Laung-Terng, Chang Yao-Wen, Cheng Kwang-Ting (Tim)
Chapter 1: Introduction Chapter 2: Fundamentals of CMOS Design Chapter 3: Design for Testability Chapter 4: Fundamentals of Algorithms Chapter 5: Electronic System-Level Design and High-Level Synthesis Chapter 6: Logic Synthesis in a Nutshell Chapter 7: Test Synthesis Chapter 8: Logic and Circuit Simulation Chapter 9: Functional Verification Chapter 10: Floorplanning Chapter 11: Placement Chapter 12: Global and Detailed Routing Chapter 13: Synthesis of Clock and Power/Ground Networks Chapter 14: Fault Simulation and Test Generation.
Yao-Wen Chang, Ph.D., is a Professor in the Department of Electrical Engineering, National Taiwan University. He recevied his Ph.D. degree in Computer Science from the University of Texas at Austin. He has published over 200 technical papers, co-authored one book, and is a winner of the ACM ISPD Placement (2006) and Global Routing (2008) contests.
Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.
- Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly
- Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence
- Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products
- Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
Date de parution : 03-2009
Ouvrage de 972 p.
19x23.3 cm
Thèmes d’Electronic Design Automation :
Mots-clés :
CMOS logic; circuit technology; test automation; scan design; algorithms; unit binding