Advances in Imaging and Electron Physics Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Charged particles in electromagnetic fields
2. Language of aberration expansions in charged particle optics
3. Transporting charged particle beams in static fields
4. Transporting charged particles in radiofrequency fields
5. Static magnetic charged particle analyzers
6. Electrostatic energy analyzers
7. Mass analyzers with combined electrostatic and magnetic fields
8. Time-of-flight mass analyzers
9. Radiofrequency mass analyzers

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.